Standard IEC standard · IEC 60749-12:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

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Standard IEC standard · IEC 60749-12:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
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Omfattning
IEC 60749-12:2017 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages This second edition cancels and replaces the first edition published in 2002. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 2007, Vibration, variable frequency.

Ämnesområden

Allmänt Halvledarkomponenter (31.080.01)


Köp denna standard

Standard IEC standard · IEC 60749-12:2017

Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
Prenumerera på standarden - Läs mer Dölj
Pris: 360 SEK
standard ikon pdf

PDF

Pris: 360 SEK
standard ikon

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Produktinformation

Språk: Engelska Franska

Framtagen av: IEC

Internationell titel: Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency

Artikelnummer: STD-80000132

Utgåva: 2

Fastställd: 2017-12-13

Antal sidor: 14

Ersätter: IEC 60749-12:2002/COR1:2003 , IEC 60749-12:2002