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Standard Swedish standard · SS-EN 62047-17

Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films

Status: Valid

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Standard Swedish standard · SS-EN 62047-17

Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
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Subjects

Other (31.080.99)

Buy this standard

Standard Swedish standard · SS-EN 62047-17

Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films
Subscribe on standards with our subscription service. When you use our service you can be assured the latest editions and easy access. Read more about SIS Subscriptions
Subscribe on standards - Read more Dölj
Price: 569 SEK
standard ikon pdf

PDF

Price: 569 SEK
standard ikon

Paper

Show more Show less

Product information

Language: English

Written by: SEK SVENSK ELSTANDARD

International title:

Article no: STD-3336875

Edition: 1

Approved: 1/13/2016

No of pages: 30